시그널 소스(펑션 제네레이터) - DTG5000시그널 소스(펑션 제네레이터) - DTG5000

Posted at 2012.04.04 10:28 | Posted in 설비/장비 정보

 

 

 

시그널 소스(펑션 제네레이터) - DTG5000

 

시그널 소스(펑션 제네레이터)

Function Generator
  • DTG5000

    DTG5000

    DTG5000 시리즈는 데이터 발생기의 성능과 펄스 발생기의 기능을 결합하여 복잡한 테스트 절차 구축 시간을 줄이고 여러 채널에 걸친 저지터 고정밀 클럭 및 직렬 데이터 신호의 생성을 간소화합니다.

DTG5000 카다로그 다운받기

Features & Benefits

  • Versatile Platform Combines Features of Data Generator, Pulse Generator, and DC Source
  • Up to 3.35 Gb/s Data Rate
  • From 1 to 96 Data Channels (Master/Slave)
  • Class Leading Delay Resolution of 0.2 ps (DTG5274/DTG5334), 1 ps(DTG5078), up to 600 ns of Total Delay
  • Modular Architecture Helps to Protect Your Investment and Allows the Instrument to Expand With Your Growing Needs
  • Advanced Control Over Signal Parameters to Meet Most Current Testing Needs, Including Stressed Eye Generation
  • Easy to Use and Learn, Shortens Time to Test
  • Up to 64 Mb Pattern Depth Per Channel for Complex Data Patterns


Applications
  • Semiconductor Device Functional Test and Characterization
  • Support for Semiconductor Technologies from TTL to LVDS
  • Initial Verification and Debugging, Comprehensive Characterization, Manufacturing, and Quality Control

  • Compliance and Interoperability Testing to Emerging Standards
  • PCI-Express Gen1:2.5 Gbps
  • Serial ATA Gen1/2:1.5 Gbps/3 Gbps
  • InfiniBand 2.5 Gbps
  • XAUI: 3.125 Gbps
  • HDMI: Version 1.3 / DVI

  • Magnetic and Optical Storage Design
  • Research, Development, and Test of Next-generation Devices (HDD, DC/DVD, Blu-ray)

  • Data Conversion Device Design
  • Characterization and Test of Next-generation D/A Convertors

  • Imaging Sensor Device Design
  • Characterization and Functional Testing of Next-generation Imaging Devices (CCD/CMOS)

  • Jitter Transfer and Jitter Tolerance Testing

 

[출처: 상일계측기 ] http://www.sieq.co.kr/
시그널 소스(펑션 제네레이터) - DTG5000
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